Semiconductor device having a stacked structure

ABSTRACT

A semiconductor device includes a substrate having a cell array region and a pad region, a stack structure including gate electrodes and mold insulating layers alternately stacked on the substrate and having a staircase shape in the pad region, first separation regions penetrating the stack structure in the pad region, extending in a first direction, and including first and second dummy insulating layers, the first dummy insulating layers covering side walls of the first separation regions and including horizontal portions covering portions of the gate electrodes, and the second dummy insulating layers disposed between the first dummy insulating layers, extending portions extending towards the mold insulating layers from the first dummy insulating layers in a second direction perpendicular to the first direction, second separation regions dividing the stack structure and extending in the first direction, and cell contact plugs penetrating the horizontal portions and connected to the gate electrodes.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority under 35 U.S.C. § 119 to Korean PatentApplication No. 10-2019-0073505, filed on Jun. 20, 2019 in the KoreanIntellectual Property Office, the disclosure of which is incorporated byreference herein in its entirety.

TECHNICAL FIELD

Exemplary embodiments of the present inventive concept relate to asemiconductor device having a stacked structure.

DISCUSSION OF RELATED ART

There has been an increasing demand for semiconductor devices withreduced volume capable of processing high capacity data. Accordingly,integration density of semiconductor elements included in semiconductordevices needs to be increased. To improve integration density of asemiconductor device, a vertical transistor structure may be usedinstead of a planar transistor structure.

SUMMARY

According to an exemplary embodiment of the present inventive concept, asemiconductor device includes a substrate having a cell array region anda pad region, a stack structure including gate electrodes and moldinsulating layers alternately stacked on the substrate and having astaircase shape in the pad region, a plurality of first separationregions penetrating the stack structure vertically in the pad region,extending in a first direction, and including first dummy insulatinglayers and second dummy insulating layers, where the first dummyinsulating layers cover internal side walls of the plurality of firstseparation regions and include horizontal portions covering portions ofupper surfaces of upper gate electrodes of the gate electrodes, and thesecond dummy insulating layers are disposed between the first dummyinsulating layers, extending portions extending towards the moldinsulating layers from the first dummy insulating layers in a seconddirection perpendicular to the first direction, a plurality of secondseparation regions dividing the stack structure into a plurality ofregions and extending in the first direction, and cell contact plugspenetrating the horizontal portions in the second dummy insulatinglayers and connected to the gate electrodes.

According to an exemplary embodiment of the present inventive concept, asemiconductor device includes a substrate having a cell array region anda pad region, a stack structure including gate electrodes and moldinsulating layers having a staircase shape in the pad region, aninterlayer insulating layer covering the stack structure in the padregion, a plurality of first separation regions penetrating the stackstructure and the interlayer insulating layer in the pad region, wherethe plurality of first separation regions include first insulatinglayers covering one end of the gate electrodes and extending in adirection substantially perpendicular to an upper surface of thesubstrate, and second insulating layers disposed between the firstinsulating layers, a plurality of second separation regions dividing thestack structure into a plurality of regions on the substrate andextending in a first direction, at least one dummy channel disposedbetween the plurality of first separation regions and the plurality ofsecond separation regions, and cell contact plugs penetrating the firstinsulating layers and connected to the gate electrodes in the pluralityof first separation regions.

According to an exemplary embodiment of the present inventive concept, asemiconductor device includes a substrate having a cell array region anda pad region, a stack structure including gate electrodes and moldinsulating layers alternately stacked on the substrate and having astaircase shape in the pad region, an interlayer insulating layercovering the stack structure in the pad region, dummy insulating layersdividing the stack structure and the interlayer insulating layer into aplurality of regions and including a material different from a materialof the interlayer insulating layer, extending portions in contact withthe dummy insulating layers in the stack structure, and spaced apartfrom one another in a direction substantially perpendicular to an uppersurface of the substrate between the gate electrodes, and cell contactplugs disposed in the dummy insulating layers and connected to the gateelectrodes.

BRIEF DESCRIPTION OF DRAWINGS

The above and other aspects and features of the present inventiveconcept will be more clearly understood by describing in detailexemplary embodiments thereof with reference to the accompanyingdrawings.

FIG. 1 is a block diagram illustrating a semiconductor device accordingto an exemplary embodiment of the present inventive concept.

FIG. 2 is an equivalent circuit diagram illustrating a cell array of thesemiconductor device of FIG. 1 according to an exemplary embodiment ofthe present inventive concept.

FIG. 3 is a plan diagram illustrating a semiconductor device accordingto an exemplary embodiment of the present inventive concept.

FIG. 4 is an enlarged diagram illustrating a region A of FIG. 3according to an exemplary embodiment of the present inventive concept.

FIG. 5A is a cross-sectional diagram illustrating a cross-sectionalsurface of the semiconductor device of FIG. 4 taken along line I-I′,according to an exemplary embodiment of the present inventive concept.

FIG. 5B is a cross-sectional diagram illustrating a cross-sectionalsurface of the semiconductor device of FIG. 4 taken along line II-II′,according to an exemplary embodiment of the present inventive concept.

FIG. 5C is an enlarged cross-sectional diagram illustrating a region Bof FIG. 5A according to an exemplary embodiment of the present inventiveconcept.

FIG. 5D is an enlarged cross-sectional diagram illustrating a region Cof FIG. 5A according to an exemplary embodiment of the present inventiveconcept.

FIG. 5E is an enlarged cross-sectional diagram illustrating a region Dof FIG. 5A according to an exemplary embodiment of the present inventiveconcept.

FIG. 5F is an enlarged cross-sectional diagram illustrating a region Eof FIG. 5A according to an exemplary embodiment of the present inventiveconcept.

FIG. 6A is a cross-sectional diagram illustrating a semiconductor deviceaccording to an exemplary embodiment of the present inventive concept.

FIG. 6B is an enlarged diagram illustrating a region B′ of FIG. 6Aaccording to an exemplary embodiment of the present inventive concept.

FIG. 7A is a cross-sectional diagram illustrating a semiconductor deviceaccording to an exemplary embodiment of the present inventive concept.

FIG. 7B is an enlarged diagram illustrating a region B″ of FIG. 7Aaccording to an exemplary embodiment of the present inventive concept.

FIGS. 8A and 8B are plan diagrams illustrating an arrangementrelationship between dummy channels and cell contact plugs of asemiconductor device according to exemplary embodiments of the presentinventive concept.

FIG. 9 is a plan diagram illustrating a semiconductor device accordingto an exemplary embodiment of the present inventive concept.

FIG. 10 is a plan diagram illustrating a region F of FIG. 9 according toan exemplary embodiment of the present inventive concept.

FIG. 11 is a cross-sectional diagram illustrating the semiconductordevice of FIG. 10 taken along line III-III′ according to an exemplaryembodiment of the present inventive concept.

FIGS. 12 to 24 are cross-sectional diagrams illustrating a method ofmanufacturing a semiconductor device according to an exemplaryembodiment of the present inventive concept.

DETAILED DESCRIPTION OF THE EMBODIMENTS

Exemplary embodiments of the present inventive concept provide asemiconductor device having improved reliability.

Hereinafter, exemplary embodiments of the present inventive concept willbe described with reference to the accompanying drawings Like referencenumerals may refer to like elements throughout this application.

FIG. 1 is a block diagram illustrating a semiconductor device accordingto an exemplary embodiment of the present inventive concept.

Referring to FIG. 1, a semiconductor device 10 may include a memory cellarray 20 and a peripheral circuit 30. The peripheral circuit 30 mayinclude a row decoder 32, a page buffer 34, an input and output buffer35, a control logic 36, and a voltage generator 37.

The memory cell array 20 may include a plurality of memory blocks, andeach of the memory blocks may include a plurality of memory cells. Theplurality of memory cells may be connected to the row decoder 32 througha string selection line SSL, word lines WL, and a ground selection lineGSL, and may be connected to the page buffer 34 through bit lines BL. Inexemplary embodiments of the present inventive concept, a plurality ofmemory cells arranged in the same row may be connected to the same wordline WL, and a plurality of memory cells arranged in the same column maybe connected to the same bit line BL.

The row decoder 32 may decode an input address ADDR from the controllogic 36, and may generate and transfer driving signals of a word lineWL. The row decoder 32 may provide a word line voltage generated by thevoltage generator 37 to each of a selected word line WL and non-selectedword lines WL in response to control of the control logic 36.

The page buffer 34 may be connected to the memory cell array 20 throughthe bit lines BL and may read out information stored in the memorycells. The page buffer 34 may temporarily store data to be stored in thememory cells or may sense data stored in the memory cells. The pagebuffer 34 may include a column decoder and a sense amplifier. The columndecoder may selectively activate the bit lines BL of the memory cellarray 20, and the sense amplifier may sense a voltage of a bit line BLselected by the column decoder in a readout operation and may read outdata stored in a selected memory cell.

The input and output buffer 35 may receive data DATA and may transferthe data DATA to the page buffer 34 during a program operation, and mayoutput the data DATA received from the page buffer 34 to an externalentity during a readout operation. The input and output buffer 35 maytransfer an input address or an input command to the control logic 36.

The control logic 36 may control operations of the row decoder 32 andthe page buffer 34. The control logic 36 may receive a control signaland an external voltage transferred from an external entity, and mayoperate in response to the received control signal. The control logic 36may control a readout operation, a writing operation, and/or an erasingoperation in response to the control signal.

The voltage generator 37 may generate a program voltage, a readoutvoltage, an erasing voltage, or the like, for example, required for aninternal operation using an external voltage. The voltage generated bythe voltage generator 37 may be transferred to the memory cell array 20through the row decoder 32.

FIG. 2 is an equivalent circuit diagram illustrating a cell array of thesemiconductor device of FIG. 1 according to an exemplary embodiment ofthe present inventive concept.

Referring to FIG. 2, the memory cell array 20 may include a plurality ofmemory cell strings S including memory cells MC connected to one anotherin series, and a ground selection transistor GST and string selectiontransistors SST1 and SST2 connected to both ends of the memory cells MCin series. The plurality of memory cell strings S may be connected tobit lines BL0 to BL2 in parallel. The plurality of memory cell strings Smay be connected to a common source line CSL in common. Accordingly, theplurality of memory cell strings S may be disposed between the pluralityof bit lines BL0 to BL2 and a single common source line CSL. In anexemplary embodiment of the present inventive concept, a plurality ofcommon source lines may be arranged two-dimensionally.

The memory cells MC, connected to one another in series, may becontrolled by word lines WL0 to WLn for selecting the memory cells MC.Each of the memory cells MC may include a data storage element. Gateelectrodes of the memory cells MC disposed at substantially the samedistance from the common source line CSL may be connected to one of theword lines WL0 to WLn and may be in an equipotential state.Alternatively, even when the gate electrodes of the memory cells MC aredisposed at substantially the same distance from the common source lineCSL, gate electrodes disposed in different rows or different columns maybe independently controlled.

The ground selection transistor GST may be controlled by the groundselection line GSL, and may be connected to the common source line CSL.The string selection transistors SST1 and SST2 may be controlled bystring selection lines SSL1 and SSL2, and may be connected to the bitlines BL0 to BL2. FIG. 2 illustrates an example in which a single groundselection transistor GST and two string selection transistors SST1 andSST2 are connected to each of the plurality of memory cells MC connectedto one another in series, but the inventive concept is not limitedthereto. A single string selection transistor may be connected to eachof the memory cells MC, or a plurality of ground selection transistorsmay be connected to each of the memory cells MC. One or more dummy linesDWL or buffer lines may further be disposed between an uppermost wordline WLn of the word lines WL0 to WLn and the string selection linesSSL1 and SSL2. In an exemplary embodiment of the present inventiveconcept, one or more dummy lines DWL may also be disposed between alowermost word line WL0 and the ground selection line GSL.

When a signal is applied to the string selection transistors SST1 andSST2 through the string selection lines SSL1 and SSL2, a signal appliedthrough the bit lines BL0 to BL2 may be transferred to the memory cellsMC connected to one another in series, and accordingly, a data readoutoperation and a data writing operation may be performed. Additionally,by applying a certain level of erasing voltage through a substrate, anerasing operation for erasing data written in the memory cells MC may beperformed. In an exemplary embodiment of the present inventive concept,the memory cell array 20 may further include at least one dummy memorycell string electrically separated from the bit lines BL0 to BL2.

FIG. 3 is a plan diagram illustrating a semiconductor device accordingto an exemplary embodiment of the present inventive concept. In FIG. 3,some configurations of a semiconductor device 100 are illustrated forunderstanding. FIG. 4 is an enlarged diagram illustrating a region A ofFIG. 3 according to an exemplary embodiment of the present inventiveconcept. FIG. 5A is a cross-sectional diagram illustrating across-sectional surface of the semiconductor device of FIG. 4 takenalong line I-I′, according to an exemplary embodiment of the presentinventive concept. FIG. 5B is a cross-sectional diagram illustrating across-sectional surface of the semiconductor device of FIG. 4 takenalong line II-II′, according to an exemplary embodiment of the presentinventive concept. FIG. 5C is an enlarged cross-sectional diagramillustrating a region B of FIG. 5A according to an exemplary embodimentof the present inventive concept. FIG. 5D is an enlarged cross-sectionaldiagram illustrating a region C of FIG. 5A according to an exemplaryembodiment of the present inventive concept. FIG. 5E is an enlargedcross-sectional diagram illustrating a region D of FIG. 5A according toan exemplary embodiment of the present inventive concept. FIG. 5F is anenlarged cross-sectional diagram illustrating a region E of FIG. 5Aaccording to an exemplary embodiment of the present inventive concept.

Referring to FIGS. 3 to 5B, the semiconductor device 100 may include asubstrate 101 having a cell array region CAR and a pad region PAD, astack structure GS including gate electrodes 130 and mold insulatinglayers 120 alternately stacked on the substrate 101, channels CHpenetrating the stack structure GS, first and second separation regionsMS1 and MS2 penetrating the stack structure GS, and cell contact plugsCCP penetrating the first separation regions MS1.

The first and second separation regions MS1 and MS2 may extend in afirst direction (an x direction), and may be disposed side by side andmay be spaced apart from each other in a second direction (a ydirection). The first and second separation regions MS1 and MS2 may bedisposed in parallel to each other. The second separation regions MS2may include second central separation regions MS2 a extending from thecell array region CAR to the pad region PAD, and second auxiliaryseparation regions MS2 b extending in the cell array region CAR andpartially spaced apart from each other in the first direction in the padregion PAD. Portions of the first separation regions MS1 may be disposedbetween the second auxiliary separation regions MS2 b in the pad regionPAD. The first separation regions MS1 may only be disposed in the padregion PAD, and each of the first separation regions MS1 may have alength shorter than a length of each of the second central separationregions MS2 a in the first direction, but the inventive concept is notlimited thereto.

The cell array region CAR may be divided into a plurality of memoryblocks by the second central separation regions MS2 a. The stackstructure GS may be divided into a plurality of regions by the secondseparation regions MS2.

The second auxiliary separation regions MS2 b may be disposed betweenthe second central separation regions MS2 a in the cell array regionCAR. The first separation regions MS1 and the second auxiliaryseparation regions MS2 b may be alternately disposed, and disposed sideby side with a certain gap therebetween in the second direction in thepad region PAD. A gap between the first and second separation regionsMS1 and MS2, and an arrangement order and the number of the first andsecond separation regions MS1 and MS2 are not limited to the exampleillustrated in FIG. 3, and may be varied. For example, a gap between thefirst separation regions MS1 and the second separation regions MS2 maynot be constant, and the first separation regions MS1 and the secondseparation regions MS2 may not be alternately disposed. The number ofthe first separation regions MS1 may be the same as the number of thesecond separation regions MS2, or the number of the first separationregions MS1 may be greater than or less than the number of the secondseparation regions MS2.

Referring to FIGS. 5A and 5B, the semiconductor device 100 may include astack structure GS in which the mold insulating layers 120 and the gateelectrodes 130 are alternately stacked on the substrate 101, the firstand second separation regions MS1 and MS2 dividing the stack structureGS into a plurality of regions, the channels CH, dummy channels DCH,cell contact plugs CCP, and a wiring layer 190. The semiconductor device100 may further include an interlayer insulating layer 60 covering thestack structure GS, a first capping insulating layer 70 covering theinterlayer insulating layer 60, and a second capping insulating layer80. The channels CH may include a channel region 140, a channelinsulating layer 145, a gate dielectric layer, and the like. The wiringlayer 190 may include a lower wiring layer 150, an intermediate wiringlayer 160, and an upper wiring layer 170, which will be described inmore detail below.

The substrate 101 may have an upper surface extending in the firstdirection and the second direction. The substrate 101 may include asemiconductor material such as a IV group semiconductor, a III-V groupcompound semiconductor, or a II-VI group oxide semiconductor. A IV groupsemiconductor may include, for example, silicon, germanium, orsilicon-germanium. The substrate 101 may be provided as a bulk wafer oran epitaxial layer.

The cell array region CAR of the substrate 101 may be a region in whichthe gate electrodes 130 may be stacked vertically and the channels CHmay be disposed, and the cell array region CAR may correspond to thememory cell array 20 illustrated in FIG. 1. The pad region PAD may be aregion in which the gate electrodes 130 may extend at different lengths,and the pad region PAD may electrically connect the memory cell array 20illustrated in FIG. 1 to the peripheral circuit 30. The pad region PADmay be disposed on at least one end of the cell array region CAR in onedirection, e.g., in the second separation regions MS2.

The gate electrodes 130 may be stacked and spaced apart from one anotherin a third direction (a z direction), and the gate electrodes 130 mayextend to the pad region PAD from the cell array region CAR at differentlengths. The gate electrodes 130 may include a lower gate electrodeincluded in gates of the ground selection transistor GST illustrated inFIG. 2, memory gate electrodes included in the plurality of memory cellsMC, and upper gate electrodes included in gates of the string selectiontransistors SST1 and SST2. The number of memory gate electrodes includedin the memory cells MC may be determined in accordance with a capacityof the semiconductor device 100. In an exemplary embodiment of thepresent inventive concept, the number of the upper and lower gateelectrodes of each of the string selection transistors SST1 and SST2 andthe ground selection transistor GST may be one or two, and the upper andlower gate electrodes may have a structure the same as or different froma structure of the memory gate electrodes of the memory cells MC. Someof the gate electrodes 130, e.g., memory gate electrodes adjacent to theupper gate electrodes or the lower gate electrode, may be dummy gateelectrodes.

The mold insulating layers 120 may be disposed between the gateelectrodes 130. The mold insulating layers 120 may be stacked and spacedapart from each other in the third direction of the substrate 101, andmay extend in the second direction.

The mold insulating layers 120 and the gate electrodes 130 may extend atdifferent lengths in the first direction and may form stepped portionsin a staircase shape in the pad region PAD of the substrate 101.Portions of the stack structure GS may extend at different lengths inthe first direction and the second direction, and may form pads formingstepped portions in a pyramid form in the pad region PAD of thesubstrate 101. The number of the stepped portions of the pads is notlimited to the example illustrated in the diagram, and may be varied.

Portions of the gate electrodes 130 included in the pad may be dummygate electrodes 130 a. The dummy gate electrodes 130 a may not be incontact with the channels CH. In the pad region PAD, the gate electrodes130 and the dummy gate electrodes 130 a may be connected to cell contactplugs CCP, and accordingly, the gate electrodes 130 may be connected tothe wiring layer 190.

The gate electrodes 130 may include a metal material, such as tungsten(W). In exemplary embodiments of the present inventive concept, the gateelectrodes 130 may include polycrystalline silicon or a metal silicidematerial. In exemplary embodiments of the present inventive concept, thegate electrodes 130 may further include a diffusion barrier, and thediffusion barrier may include tungsten nitride (WN), tantalum nitride(TaN), titanium nitride (TiN), or combinations thereof. The moldinsulating layers 120 may include an insulating material such as siliconoxide or silicon nitride.

The interlayer insulating layer 60 may cover the substrate 101, and thestack structure GS on the substrate 101. The interlayer insulating layer60 may include an insulating material such as silicon oxide or siliconnitride.

The channels CH may form rows and columns on the cell array region CARand may be spaced apart from one another. The channels CH may bedisposed in lattice form or may be disposed in a zigzag form in onedirection. Each of the channels CH may have a cylindrical shape, and mayhave an inclined side surface of which a width decreases towards thesubstrate 101 depending on an aspect ratio. In exemplary embodiments ofthe present inventive concept, the channels CH may have a “U” shapedform in which lower portions of the channels CH are connected to oneanother. In exemplary embodiments of the present inventive concept, thedummy channels DCH may also be disposed on end portions of the cellarray region CAR adjacent to the pad region PAD and in the pad regionPAD. The dummy channels DCH may have a structure the same as or similarto a structure of the channels CH, and may not perform any substantialfunction in the semiconductor device 100.

The channel region 140 may be disposed in the channels CH. The channelregion 140 in the channels CH may have an annular form surrounding thechannel insulating layer 145, but the inventive concept is not limitedthereto. In an exemplary embodiment of the present inventive concept,the channel region 140 may have a columnar shape such as a cylindricalshape or a prism shape. The channel region 140 may include asemiconductor material such as polycrystalline silicon or singlecrystalline silicon, and the semiconductor material may be an undopedmaterial or a material including p-type or n-type impurities.

Channel pads 146 may be disposed on the channel region 140 in thechannels CH. The channel pads 146 may cover an upper surface of thechannel insulating layer 145 and may be electrically connected to thechannel region 140. The channel pads 146 may include dopedpolycrystalline silicon, for example.

The gate dielectric layer may be disposed between the gate electrodes130 and the channel region 140. The gate dielectric layer may include atunneling layer, an electric charge storage layer, and a blocking layer,layered in order from the channel region 140. The tunneling layer maytunnel electric charge to the electric charge storage layer, and mayinclude silicon oxide (SiO₂), silicon nitride (Si₃N₄), siliconoxynitride (SiON), or combinations thereof. The electric charge storagelayer may be an electric charge trapping layer or a floating gateconductive layer. The blocking layer may include silicon oxide (SiO₂),silicon nitride (Si₃N₄), silicon oxynitride (SiON), a high-k material,or combinations thereof. In exemplary embodiments of the presentinventive concept, at least a portion of the gate dielectric layer mayextend in a horizontal direction along the gate electrodes 130.

As illustrated in FIG. 5A, the first and second separation regions MS1and MS2 may penetrate the gate electrodes 130, the mold insulatinglayers 120, and the interlayer insulating layer 60, stacked on thesubstrate 101, in the third direction perpendicular to the upper surfaceof the substrate 101, and may be in contact with the substrate 101.Accordingly, the first and second separation regions MS1 and MS2 maypenetrate the stack structure GS and may be in contact with thesubstrate 101.

Each of the first and second separation regions MS1 and MS2 may have aninclined side surface of which a width of a lower portion decreases morethan a width of an upper portion towards the substrate 101 depending onan aspect ratio. For example, referring to FIG. 5F, an upper portion ofeach of the first separation regions MS1 may have a first width, and alower portion of each of the first separation regions MS1 may have asecond width. The first width may be greater than the second width.

The first separation regions MS1 may be disposed side by side and may bespaced apart from one another between the second separation regions MS2.Each of the first separation regions MS1 may have a width greater than awidth of each of the second separation regions MS2 in the seconddirection. An internal space of each of the first separation regions MS1may be filled with first dummy insulating layers DIL1 and second dummyinsulating layers DIL2, but the inventive concept is not limitedthereto. For example, an internal space of each of the first separationregions MS1 may include a single layer including an insulating materialdifferent from a material of the interlayer insulating layer 60. Thefirst dummy insulating layers DIL1 may be disposed on both inclined sidewalls of the first separation regions MS1, may extend in the thirddirection, may be in contact with the substrate 101, and may also extendin the first direction. The second dummy insulating layers DIL2 may bedisposed between the first dummy insulating layers DILL may extend inthe third direction, may be in contact with the substrate 101, and mayalso extend in the first direction. The first dummy insulating layersDIL1 and second dummy insulating layers DIL2 may include differentmaterials.

Upper surfaces of the second separation regions MS2 may be disposed on alevel higher than upper surfaces of the first separation regions MS1,and may be disposed on a level higher than upper surfaces of the dummychannels DCH.

Referring to FIG. 5B, the line II-II′ may cut the semiconductor device100 in the first direction in which the first separation regions MS1extend in the pad region PAD, and may penetrate and cut the channels CHin the cell array region CAR.

As illustrated in FIG. 5B, the semiconductor device 100 may include thegate electrodes 130, the mold insulating layers 120, horizontal portions124, extending portions 125, the interlayer insulating layer 60, thecell contact plugs CCP, the second dummy insulating layers DIL2, and thelike. In a portion of the pad region PAD in which the first separationregions MS1 are disposed, a space between the gate electrodes 130 may befilled with the extending portions 125 instead of the mold insulatinglayers 120. The extending portions 125 may be connected to thehorizontal portions 124 covering a portion of an upper surface of eachof the gate electrodes 130.

The cell contact plugs CCP may penetrate the horizontal portions 124 andmay be in contact with the gate electrodes 130 on end portions of thegate electrodes 130.

FIG. 5C illustrates an arrangement structure of the extending portions125.

Referring to FIG. 5C, the extending portions 125 may be disposedadjacent to the first separation regions MS1. One end of the extendingportions 125 may be in contact with external side surfaces of the firstdummy insulating layers DIL1 in the second direction, and the other endof the extending portions 125 may be in contact with the mold insulatinglayers 120 in the second direction. A thickness of each of the extendingportions 125 taken in the third direction may be substantially the sameas a thickness of each of the mold insulating layers 120 taken in thethird direction. The first dummy insulating layers DIL1 may extend inthe third direction, and may be in contact with the interlayerinsulating layer 60. The extending portions 125 may be layers covering aregion between the gate electrodes 130 and side walls of the moldinsulating layers 120 and in contact with the first dummy insulatinglayers DILL The horizontal portions 124 may be layers on upper surfacesof uppermost gate electrodes 130, and may be portions of the first dummyinsulating layers DILL

The extending portions 125 may be spaced apart from one another with thefirst separation regions MS1 interposed therebetween in the seconddirection, and partial regions of the extending portions 125 may bespaced apart from one another with the gate electrodes 130 interposedtherebetween in the third direction. The extending portions 125 may beconfigured to be surrounded by the first dummy insulating layers DILLthe mold insulating layers 120, the gate electrodes 130, and the seconddummy insulating layers DIL2.

The extending portions 125 may extend towards the mold insulating layers120 from the first dummy insulating layers DIL1 in the second direction.Accordingly, the first dummy insulating layers DIL1 and the extendingportions 125 may have serrations or may have a fishbone form. The firstdummy insulating layers DIL1 and the extending portions 125 may work asa support stand to prevent collapse of the mold insulating layers 120.

Positions of one end of the extending portions 125 may be different fromone another in the second direction. As a width of each of the firstseparation regions MS1 taken in the second direction decreases towardsthe substrate 101, the closer the extending portions 125 are to thesubstrate 101, and the shorter the distance is between the extendingportions 125 in the second direction. Accordingly, a width of each ofthe extending portions 125 taken in the second direction may decrease.For example, the extending portions 125 may include a first extendingportion 125-1 and a second extending portion 125-2, and the secondextending portion 125-2 may be disposed closer to the substrate 101 thanthe first extending portion 125-1, and one end on which the secondextending portion 125-2 opposes the mold insulating layers 120 in thesecond direction may be different from one end on which the firstextending portion 125-1 opposes the mold insulating layers 120 in thesecond direction.

The extending portions 125 may be formed of a material different frommaterials of the mold insulating layers 120 and the gate electrodes 130,and may be formed of a material the same as a material of the firstdummy insulating layers DILL For example, the first dummy insulatinglayers DIL1 and the extending portions 125 may include aluminum oxide(Al₂O₃), but the inventive concept is not limited thereto.

In exemplary embodiments of the present inventive concept, as theextending portions are disposed on etched ends of the mold insulatinglayers 120, a length of each of the mold insulating layers 120 in thesecond direction may decrease. Accordingly, during a gate replacementprocess, supporting force of the dummy channels DCH in contact with themold insulating layers 120 may improve such that collapse of the moldinsulating layers 120 may be prevented, and a bridge defect may bereduced.

A portion of the stack structure GS may include regions which are notconnected to the second separation regions MS2. Accordingly, portions ofsacrificial layers 180 may not be selectively removed with respect tothe mold insulating layers 120 during a gate replacement process, and atleast one region in which the sacrificial layers 180 remain may bepresent in the semiconductor structure. For example, the sacrificiallayers 180 disposed on an uppermost end, between the first separationregions MS1 and the second separation regions MS2 and not penetrated bythe second separation regions MS2, may remain.

The sacrificial layers 180 may be disposed on substantially the samelevel as the upper gate electrodes of the gate electrodes 130 connectedto the cell contact plugs CCP, and one end of the sacrificial layers 180may be surrounded by the first dummy insulating layers DILL the seconddummy insulating layers DIL2, and the extending portions 125. Thesacrificial layers 180 may be disposed between the horizontal portions124 and the extending portions 125, and may include a material differentfrom a material of the gate electrodes 130.

FIG. 5D illustrates the region C in which the cell contact plugs CCP ofthe semiconductor device 100 are in contact with the gate electrodes 130according to an exemplary embodiment of the present inventive concept.

The upper gate electrodes of the gate electrodes 130 may be in contactwith the cell contact plugs CCP and may be used to electrically connectthe wiring layer 190 to the memory cells MC. The extending portions 125may be disposed below the upper gate electrodes.

The first dummy insulating layers DIL1 may include the horizontalportions 124 covering upper surfaces of the upper gate electrodes.Accordingly, portions of the first dummy insulating layers DIL1 mayinclude the horizontal portions 124 disposed substantially in parallelto the upper surface of the substrate 101. The horizontal portions 124may be in contact with the second dummy insulating layers DIL2. Thehorizontal portions 124 may provide a contact region connecting an upperwiring to the gate electrodes 130, and may be penetrated by the cellcontact plugs CCP in the third direction. The cell contact plugs CCP maybe disposed in the first separation regions MS1, may penetrate thesecond separation regions MS2 in the third direction, may penetrate thehorizontal portions 124 in the third direction, and may be in contactwith the upper gate electrodes.

The horizontal portions 124 may include a material different from amaterial of the mold insulating layers 120, and may include a materialthe same as a material of the extending portions 125. As a material ofthe horizontal portions 124, an insulating material having an etchselectivity different from an etch selectivity of the second separationregions MS2 and the mold insulating layers 120 may be selected undercertain conditions. For example, the horizontal portions 124 may includealuminum oxide (Al₂O₃), but the inventive concept is not limitedthereto. As the horizontal portions 124 includes a material inconsideration of etch selectivity, during an etching process for formingthe cell contact plugs CCP, an etching speed in the horizontal portions124 may be slower than an etching speed in the second dummy insulatinglayers DIL2. Accordingly, a depth of a contact region of the cellcontact plugs CCP may be adjusted. As a depth of the contact region ofthe cell contact plugs CCP is adjusted, the cell contact plugs CCP and athrough wiring may be formed in the same process.

As the semiconductor device 100 includes the extending portions 125 andthe horizontal portions 124, a punching defect in which the cell contactplugs CCP are in contact with lower gate electrodes of the gateelectrodes 130 disposed below the upper gate electrodes may beprevented.

The horizontal portions 124 and the extending portions 125 may beconfigured to surround one end of the upper gate electrodes 130, and theextending portions 125 may be contacted by an external side surface ofthe first dummy insulating layer DILL In an exemplary embodiment of thepresent inventive concept, when the first dummy insulating layer DIL1extending in the third direction, the horizontal portions 124, which area portion of the first dummy insulating layer DILL and the extendingportions 125 extending towards the mold insulating layers 120 from theexternal side surface of the first dummy insulating layer DIL1 areformed of the same material, the first dummy insulating layer DILL thehorizontal portions 124, and the extending portions 125 may be includedin and referred to as a first insulating layer.

FIG. 5E illustrates the region D of the semiconductor device 100 inwhich the plurality of cell contact plugs CCP are in contact with theplurality of gate electrodes 130, respectively. FIG. 5E particularlyillustrates cross-sectional surfaces of the first separation regionsMS1, including a boundary surface on which stepped portions of pads arepresent, in the pad region PAD.

As stepped portions of the upper gate electrodes are present in the padregion PAD, there may be a difference in heights among the horizontalportions 124 covering the upper gate electrodes. A height difference H1of the horizontal portions 124 in the third direction may besubstantially the same as a height of each of the stepped portions ofthe gate electrodes 130, and accordingly, the height difference H1 maybe substantially the same as a sum of a first thickness of a single gateelectrode 130 taken in the third direction and a second thickness of asingle mold insulating layer 120 taken in the third direction.

The semiconductor device 100 may include at least one first separationregion MS1 including two cell contact plugs CCP. Each of the cellcontact plugs CCP may penetrate the second dummy insulating layers DIL2,may penetrate the horizontal portions 124, and may be electricallyconnected to the gate electrodes 130. For example, the cell contactplugs CCP may penetrate one of the second dummy insulating layers DIL2,may include first and second cell contact plugs having different heightsin the third direction, and may be electrically connected to the gateelectrodes 130, respectively. A difference in heights between the firstand second cell contact plugs may be substantially the same as a sum ofa first thickness of a single gate electrode 130 taken in the thirddirection and a second thickness of a single mold insulating layer 120taken in the third direction.

The first separation regions MS1 may include upper first separationregions in contact with the interlayer insulating layer 60 and lowerfirst separation regions in contact with the stack structure GS. Each ofthe upper first separation regions may have a first width W1 in thesecond direction, and the lower first separation regions may have asecond width W2 in the second direction. The first width W1 may begreater than the second width W2. A minimum value of the first width W1may be greater than a maximum value of the second width W2.

FIG. 6A is a cross-sectional diagram illustrating a semiconductor deviceaccording to an exemplary embodiment of the present inventive concept.

FIG. 6B is an enlarged diagram illustrating a region B′ of FIG. 6Aaccording to an exemplary embodiment of the present inventive concept.

Referring to FIGS. 6A and 6B, in a semiconductor device 100 a, aninternal space of the first separation regions MS1 may be filled withthe second dummy insulating layers DIL2. Accordingly, in comparison withFIG. 5A, as the first separation regions MS1 do not include the firstdummy insulating layers DILL a configuration of an insulating layer maybe different. Each of the second separation regions MS2 may have aninclined side surface of which a width of a lower portion is less than awidth of an upper portion depending on an aspect ratio.

Extending portions 125 a may be disposed adjacent to the firstseparation regions MS1, one end of the extending portions 125 a may bein contact with the second dummy insulating layers DIL2 in the seconddirection, and the other end of the extending portions 125 a may be incontact with the mold insulating layers 120 in the second direction. Athickness of each of the extending portions 125 a taken in the thirddirection may be substantially the same as a thickness of each of themold insulating layers 120 taken in the third direction. The extendingportions 125 a may be spaced apart from one another with the firstseparation regions MS1 interposed therebetween in the second direction,and may be spaced apart from one another with gate electrodes 130interposed therebetween in the third direction. The extending portions125 a may be configured to be surrounded by the second dummy insulatinglayers DIL2, the mold insulating layers 120, and the gate electrodes130.

The extending portions 125 a may include a material different from amaterial of the mold insulating layers 120, and may include a materialthe same as a material of the horizontal portions 124. As a material ofthe extending portions 125 a, an insulating material having an etchselectivity different from an etch selectivity of the second dummyinsulating layers DIL2 and the mold insulating layers 120 may beselected under certain conditions. For example, the extending portions125 a may include aluminum oxide (Al₂O₃), but the inventive concept isnot limited thereto.

The semiconductor device 100 a may further include the horizontalportions 124 covering a portion of an upper surface of each of uppergate electrodes of the gate electrodes 130. The horizontal portions 124may be in contact with the second dummy insulating layers DIL2. Thehorizontal portions 124 may provide a contact region connecting an upperwiring to the gate electrodes 130, and may be penetrated by the cellcontact plugs CCP in the third direction.

The horizontal portions 124 may include a material different from amaterial of the mold insulating layers 120, and may include a materialthe same as a material of the extending portions 125 a. As a material ofthe horizontal portions 124, an insulating material having an etchselectivity different from an etch selectivity of the second dummyinsulating layers DIL2 and the mold insulating layers 120 may beselected under certain conditions. For example, the horizontal portions124 may include aluminum oxide (Al₂O₃), but the inventive concept is notlimited thereto. As the horizontal portions 124 includes a material inconsideration of etch selectivity, during an etching process for formingthe cell contact plugs CCP, an etching speed in the horizontal portions124 may be slower than an etching speed in the second dummy insulatinglayers DIL2. Accordingly, a depth of the contact region of the cellcontact plugs CCP may be adjusted. As a depth of the contact region ofthe cell contact plugs CCP is adjusted, the cell contact plugs CCP and athrough wiring may be formed in the same process.

FIG. 7A is a cross-sectional diagram illustrating a semiconductor deviceaccording to an exemplary embodiment of the present inventive concept.

FIG. 7B is an enlarged diagram illustrating a region B″ of FIG. 7Aaccording to an exemplary embodiment of the present inventive concept.

Referring to FIGS. 7A and 7B, in a semiconductor device 100 b, firstseparation regions MS1 may include first dummy insulating layers DIL1and second dummy insulating layers DIL2, and each of the first dummyinsulating layers DIL1 and the second dummy insulating layers DIL2 mayhave a shape different from the example embodiment illustrated in FIGS.5A and 5C.

In exemplary embodiments of the present inventive concept, each ofextending portions 125 b may have a recess portion DS. The extendingportions 125 b may uniformly extend along upper and lower surfaces ofthe gate electrodes 130 such that the recess portion DS may be disposedbetween the gate electrodes 130 disposed upwardly and downwardly. Athickness of the recess portion DS taken in the third direction may beless than a thickness of each of the extending portions 125 b taken inthe third direction, and a width of the recess portion DS taken in thesecond direction may be less than a width of each of the extendingportions 125 b taken in the second direction. The recess portion DS mayextend in the first direction, and an internal space of the recessportion DS may be filled with the second dummy insulating layers DIL2.Due to the recess portion DS of the extending portions 125 b, the firstdummy insulating layers DIL1 and the extending portions 125 b may formserrations. The first dummy insulating layers DIL1 and the extendingportions 125 b may be configured to surround one end of the gateelectrodes 130.

FIGS. 7A and 7B illustrate an exemplary embodiment in which a shape ofeach of the extending portions (e.g., 125 b) is different from theaforementioned exemplary embodiments, and a shape of each of theextending portions is not limited to the exemplary embodimentillustrated in FIGS. 7A and 7B. For example, a cross-sectional surfaceof each of the extending portions may have a square shape, a rectangularshape, a trapezoid shape, a triangular shape, a semi-circular shape, orthe like, and a cross-sectional surface of the recess portion DS mayhave a square shape, a rectangular shape, a trapezoid shape, atriangular shape, a semi-circular shape, or the like.

FIGS. 8A and 8B are plan diagrams illustrating an arrangementrelationship between dummy channels and cell contact plugs of asemiconductor device according to exemplary embodiments of the presentinventive concept.

Each of the upper first separation regions may have the first width W1in the second direction, and the lower first separation regions may havethe second width W2 in the second direction. The first width W1 may begreater than the second width W2.

The cell contact plugs CCP may be disposed in the first separationregions MS1, and a plurality of the dummy channels DCH may be disposedbetween the first separation regions MS1 and the second separationregions MS2. For example, as illustrated in FIG. 8A, one dummy channelDCH may be disposed in each section, and as illustrated in FIG. 8B, fourdummy channels DCH may be disposed in each section. In an exemplaryembodiment of the present inventive concept, as the cell contact plugsCCP are disposed in the first separation regions MS1, the cell contactplugs CCP and the dummy channels DCH may be spaced apart from each otherwith the first dummy insulating layer DIL1 interposed therebetween.Accordingly, the dummy channels DCH may be disposed independently fromthe cell contact plugs CCP. Thus, the dummy channels DCH may be disposedrelatively more densely. The number and an arrangement of the dummychannels DCH are not limited to the exemplary embodiments illustrated inFIGS. 8A and 8B, and may be varied.

FIG. 9 is a plan diagram illustrating a semiconductor device accordingto an exemplary embodiment of the present inventive concept. FIG. 10 isa plan diagram illustrating a region F of FIG. 9 according to anexemplary embodiment of the present inventive concept. FIG. 11 is across-sectional diagram illustrating the semiconductor device of FIG. 10taken along line III-III′ according to an exemplary embodiment of thepresent inventive concept.

Referring to FIGS. 9 to 11, a semiconductor device 200 may include amemory cell region CELL and a peripheral circuit region PERI. The memorycell region CELL may be disposed on the peripheral circuit region PERI.Alternatively, in exemplary embodiments of the present inventiveconcept, the memory cell region CELL may be disposed below theperipheral circuit region PERI. The memory cell region CELL may includethe substrate 101, the gate electrodes 130 disposed on the substrate101, and the channels CH penetrating the gate electrodes 130. Theperipheral circuit region PERI may include a base substrate 201, circuitelements 220 disposed on the base substrate 201, circuit contact plugs270, and wiring lines 280.

The base substrate 201 may have an upper surface extending in the firstdirection and the second direction. The base substrate 201 may includeelement separation layers such that an active region may be defined.Source/drain regions 205 including impurities may be disposed in aportion of the active region. The base substrate 201 may include asemiconductor material such as a IV group semiconductor, a III-V groupcompound semiconductor, or a II-VI group oxide semiconductor.

The circuit elements 220 may include a planar transistor. Each of thecircuit elements 220 may include a circuit gate insulating layer 222, aspacer layer 224, and a circuit gate electrode 225. The source/drainregions 205 may be disposed in the base substrate 201 on both sides ofthe circuit gate electrode 225.

A peripheral region insulating layer 290 may be disposed on the circuitelements 220 on the base substrate 201. The circuit contact plugs 270may penetrate the peripheral region insulating layer 290 and may beconnected to the source/drain regions 205. An electrical signal may beapplied to the circuit elements 220 by the circuit contact plugs 270. Ina region not illustrated in the diagram, the circuit contact plugs 270may also be connected to the circuit gate electrode 225. The wiringlines 280 may be connected to the circuit contact plugs 270, and may bedisposed as a plurality of layers.

The semiconductor device 200 may be manufactured by forming theperipheral circuit region PERI and the memory cell region CELL byforming the substrate 101 of the memory cell region CELL on an upperportion of the peripheral circuit region PERI. The substrate 101 mayhave a size that is substantially the same as a size of the basesubstrate 201, or may have a size smaller than a size of the basesubstrate 201.

The gate electrodes 130 in the pad region PAD may be electricallyconnected to the circuit elements 220 in the peripheral circuit regionPERI through the wiring layers 190 and the cell contact plugs CCP. Athrough wiring 155 may connect the wiring layer 190 in the pad regionPAD to the wiring lines 280 in the peripheral circuit region PERI.

The through wiring 155 may be disposed in a central region of the padregion PAD. The through wiring 155 may penetrate the interlayerinsulating layer 60, the stack structure GS, the substrate 101 in thepad region PAD, and the peripheral region insulating layer 290, and thesacrificial layers 180 which are not substituted for tungsten (W) duringa gate replacement process may be included in the stack structure GS.

As a depth of a contact region may be adjusted during an etching processfor forming the cell contact plugs CCP, the cell contact plugs CCP andthe through wiring 155 may be formed in the same process. Accordingly,while the same process is performed, the time in which the cell contactplugs CCP penetrates the horizontal portions 124 of the first dummyinsulating layers DIL1 may be increased, and accordingly, the time inwhich the through wiring 155 penetrates the interlayer insulating layer60, the stack structure GS, the substrate 101, and the peripheral regioninsulating layer 290 and is connected to the wiring lines 280 in theperipheral circuit region PERI may be secured.

FIGS. 12 to 24 are cross-sectional diagrams illustrating a method ofmanufacturing a semiconductor device according to an exemplaryembodiment of the present inventive concept.

Referring to FIG. 12, the sacrificial layers 180 and the mold insulatinglayers 120 may be alternately stacked on the substrate 101. A portion ofeach of the sacrificial layers 180 and the mold insulating layers 120may be removed to extend the sacrificial layers 180 by different lengthsin the second direction in the pad region PAD.

The sacrificial layers 180 may be replaced with gate electrodes 130through a subsequent process. The sacrificial layers 180 may be formedof a material having an etch selectivity with respect to the moldinsulating layers 120 and may be able to be etched. For example, themold insulating layers 120 may be formed of at least one of siliconoxide and silicon nitride, and the sacrificial layers 180 may be formedof a material selected from among silicon, silicon oxide, siliconcarbide, or silicon nitride, different from a material of the moldinsulating layers 120.

In exemplary embodiments of the present inventive concept, a thicknessof each of the mold insulating layers 120 and a thickness of each of thesacrificial layers 180 may be relatively thin in consideration of arelationship with the other elements. In exemplary embodiments of thepresent inventive concept, thicknesses of the mold insulating layers 120may not be the same. For example, each of lowermost mold insulatinglayers 120 may have a relatively thin thickness, and each of uppermostmold insulating layers 120 may have a relatively great thickness.Thicknesses of the mold insulating layers 120 and the sacrificial layers180 and the number of included films are not limited to the exemplaryembodiment illustrated in the diagram, and may be varied.

A photolithography process and an etching process may be repeatedlyperformed on the sacrificial layers 180 such that upper sacrificiallayers 180 may extend less than lower sacrificial layers 180 in the padregion PAD. Accordingly, the sacrificial layers 180 may form a staircaseshape. A material for forming the sacrificial layers 180 may beadditionally deposited in regions in which the sacrificial layers 180extend further than the upper sacrificial layers 180, and each of endportions of the sacrificial layers 180 may have a relatively greatthickness. The interlayer insulating layer 60 covering an upper portionof a stack structure of the sacrificial layers 180 and the moldinsulating layers 120 may be formed.

A first opening OP1 penetrating the sacrificial layers 180 and the moldinsulating layers 120 may be formed.

The first opening OP1 may be formed by forming a mask layer using aphotolithography process, and performing a first etching process, e.g.,anisotropic etching of the sacrificial layers 180 and the moldinsulating layers 120. The first opening OP1 may be formed in a trenchform extending in the second direction, and a width of the first openingOP1 taken in the second direction may decrease towards the substrate101. The first opening OP1 may extend in the first direction. In thefirst etching process, the substrate 101 may be exposed in a lowerportion of the first opening OP1, and side walls of the sacrificiallayers 180 and side walls of the mold insulating layers 120 may beexposed on both side walls of the first opening OP1.

Referring to FIG. 13, an extended first opening EOP1 may be formed byperforming a second etching process for selectively etching side wallsof the interlayer insulating layer 60, side walls of the exposedsacrificial layers 180, and side walls of the mold insulating layers120. The extended first opening EOP1 may be formed through the secondetching process, additionally etching the first opening OP1 in the firstdirection. Portions of upper surfaces and lower surfaces of thesacrificial layers 180 may be exposed through the extended first openingEOP1.

Referring to FIG. 14, the first dummy insulating layers DIL1 and theextending portions 125 may be formed in the extended first opening EOP1.The first dummy insulating layers DIL1 and the extending portions 125may be formed using an atomic layer deposition (ALD) process or achemical vapor deposition (CVD) process. The first dummy insulatinglayers DIL1 and the extending portions 125 may include a materialdifferent from a material of the mold insulating layers 120. Forexample, the first dummy insulating layers DIL1 and the extendingportions 125 may include aluminum oxide (Al₂O₃), but the inventiveconcept is not limited thereto.

The extending portions 125 may be formed on portions of upper and lowersurfaces of the sacrificial layers 180, exposed through the extendedfirst opening EOP1, and on side walls of the mold insulating layers 120.A thickness of each of the extending portions 125 taken in the thirddirection may be substantially the same as a thickness of each of themold insulating layers 120 taken in the third direction.

As the first dummy insulating layers DIL1 are formed in the extendedfirst opening EOP1, the first dummy insulating layers DIL1 may be formedalong both side walls of the extended first opening EOP1. The firstdummy insulating layers DIL1 may cover a portion of an upper surface ofthe interlayer insulating layer 60 which is not etched. The horizontalportions 124 disposed substantially in parallel with the substrate 101may be included in a region in which the first dummy insulating layersDIL1 are in contact with upper gate electrodes 130. The horizontalportions 124 may cover a portion of an upper surface of each of theupper gate electrodes 130.

Referring to FIG. 15, a space between the first dummy insulating layersDIL1 may be filled with the second dummy insulating layers DIL2 in theextended first opening EOP1. The second dummy insulating layers DIL2 maycover an upper surface of the interlayer insulating layer 60. The seconddummy insulating layers DIL2 may be formed by an atomic layer deposition(ALD) process or a chemical vapor deposition (CVD) process. The seconddummy insulating layers DIL2 may include a material different from amaterial of the first dummy insulating layers DILL For example, thesecond dummy insulating layers DIL2 may include an insulating materialsuch as silicon oxide or silicon nitride.

The first dummy insulating layers DIL1 and the second dummy insulatinglayers DIL2 may be included in the first separation regions MS1.

Referring to FIG. 16, a planarization process may be performed on upperportions of the first dummy insulating layers DILL the second dummyinsulating layers DIL2, and the interlayer insulating layer 60 using achemical mechanical polishing (CMP) process.

Referring to FIG. 17, the dummy channels DCH penetrating the interlayerinsulating layer 60, the sacrificial layers 180, and the mold insulatinglayers 120 may be formed. The dummy channels DCH may be formed togetherwith the channels CH of the cell array region CAR in the same process,and may have a structure the same as a structure of internal regions ofthe channels CH.

Referring to FIG. 18, a second opening OP2 penetrating the sacrificiallayers 180 and the mold insulating layers 120 may be formed.

The second opening OP2 may be formed by forming a mask layer using aphotolithography process and performing an anisotropic etching processon the sacrificial layers 180 and the mold insulating layers 120. Thesecond opening OP2 may have a trench form extending in the seconddirection, and a width of the second opening OP2 may decrease towardsthe substrate 101. The second opening OP2 may extend in the firstdirection. In this process, the substrate 101 may be exposed in a lowerportion of the second opening OP2, and side walls of the sacrificiallayers 180 and side walls of the mold insulating layers 120 may beexposed on both side walls of the second opening OP2.

Referring to FIG. 19, the sacrificial layers 180 may be removed throughthe second opening OP2.

The sacrificial layers 180 may be selectively removed with respect tothe mold insulating layers 120 using a wet etching process. Accordingly,a plurality of side surface openings may be formed between the moldinsulating layers 120, and portions of side walls of the dummy channelsDCH may be exposed through the side surface openings. In this process,structural stability of the mold insulating layers 120 may degrade afterthe sacrificial layers 180 are removed, but the mold insulating layers120 may be stably supported by the extending portions 125 each having afishbone shape and adjacent to the mold insulating layers 120, the firstdummy insulating layers DILL and the dummy channels DCH. As theextending portions 125, the first dummy insulating layers DILL and thedummy channels DCH may work as support stands, collapse of the moldinsulating layers 120 may be prevented. Accordingly, a bridge defectcaused by a decrease of widths of the mold insulating layers 120 and thegate electrodes 130 in the third direction may be prevented. That isbecause a length of each of the mold insulating layers 120 supported bya single dummy channel DCH, taken in the second direction, may decreaseby the formation of the extending portions 125.

In this process, portions of the sacrificial layers 180 may not beselectively removed with respect to the mold insulating layers 120 andmay remain. For example, uppermost sacrificial layers of the sacrificiallayers 180, which are disposed between the second opening OP2 and thefirst separation regions MS1 and are not penetrated by the secondopening OP2, may remain.

Referring to FIG. 20, a region from which the sacrificial layers 180 areremoved may be filled with a conductive material, thus forming the gateelectrodes 130.

The gate electrodes 130 may include a metal, polycrystalline silicon, ora metal silicide material. The second opening OP2 may provide a transferpath for a material for forming the gate electrodes 130.

In exemplary embodiments of the present inventive concept, a thicknessof each of the mold insulating layers 120 and a thickness of each of thegate electrodes 130 may be relatively thin in consideration of arelationship with the other elements. In exemplary embodiments of thepresent inventive concept, thicknesses of the gate electrodes 130 maynot be the same. For example, the gate electrode 130 in a lowermostportion may have a relatively thin thickness, and the gate electrode 130in an uppermost portion may have a relatively great thickness.Thicknesses of the gate electrodes 130 may be relatively thin inconsideration of a relationship with the other elements.

Referring to FIG. 21, the second opening OP2 may be filled with aninsulating material such as silicon oxide or silicon nitride, and may beincluded in the second separation regions MS2 of the semiconductordevice 100. Upper surfaces of the second separation regions MS2 may bedisposed on a level higher than upper surfaces of the first separationregions MS1, and may be disposed on a level higher than upper surfacesof the dummy channels DCH.

Referring to FIGS. 22 and 23, the first capping insulating layer 70covering an upper surface of the interlayer insulating layer 60 may beformed. The cell contact plugs CCP penetrating the second dummyinsulating layers DIL2, penetrating the horizontal portions 124 of thefirst dummy insulating layers DILL and in contact with the gateelectrodes 130 may be formed. The lower wiring layer 150 in contact withthe cell contact plugs CCP and disposed on an upper surface of the firstcapping insulating layer 70 may be formed.

Referring to FIG. 24, the second capping insulating layer 80 covering anupper surface of the first capping insulating layer 70 and an uppersurface of the lower wiring layer 150 may be formed. The intermediatewiring layer 160 penetrating the second capping insulating layer 80 andin contact with the lower wiring layer 150 may be formed. The upperwiring layer 170 (as shown in FIG. 5B) in contact with the intermediatewiring layer 160 and disposed on an upper surface of the second cappinginsulating layer 80 may be formed.

The lower wiring layer 150, the intermediate wiring layer 160, and theupper wiring layer 170 may be included in and referred to as the wiringlayer 190, and may be electrically connected to the cell contact plugsCCP.

According to the aforementioned exemplary embodiments of the presentinventive concept, by controlling a structure of a region in which thecell contact plugs are in contact with the gate electrodes and a regionin which the dummy separation regions are in contact with the moldinsulating layers, a semiconductor device having improved electricalproperties may be provided.

While the present inventive concept has been shown and described abovewith reference to exemplary embodiments thereof, it will be apparent tothose of ordinary skill in the art that modifications and variations inform and details could be made thereto without departing from the spiritand scope of the present inventive concept as set forth by the appendedclaims.

What is claimed is:
 1. A semiconductor device, comprising: a substratehaving a cell array region and a pad region; a stack structure includinggate electrodes and mold insulating layers alternately stacked on thesubstrate and having a staircase shape in the pad region; a plurality offirst separation regions penetrating the stack structure vertically inthe pad region, extending in a first direction, and including firstdummy insulating layers and second dummy insulating layers, wherein thefirst dummy insulating layers cover internal side walls of the pluralityof first separation regions and include horizontal portions coveringportions of upper surfaces of upper gate electrodes of the gateelectrodes, and the second dummy insulating layers are disposed betweenthe first dummy insulating layers; extending portions extending towardsthe mold insulating layers from the first dummy insulating layers in asecond direction perpendicular to the first direction; a plurality ofsecond separation regions dividing the stack structure into a pluralityof regions and extending in the first direction; and cell contact plugspenetrating the horizontal portions in the second dummy insulatinglayers and connected to the gate electrodes.
 2. The semiconductor deviceof claim 1, wherein the extending portions include a first extendingportion and a second extending portion disposed on different levels in athird direction substantially perpendicular to an upper surface of thesubstrate, and one end of the first extending portion and one end of thesecond extending portion are disposed in different positions in thesecond direction.
 3. The semiconductor device of claim 1, wherein thefirst dummy insulating layers are in contact with the extending portionsthrough an external side surface of the first dummy insulating layers.4. The semiconductor device of claim 1, wherein each of the extendingportions has a recess portion having a concave shape in the seconddirection.
 5. The semiconductor device of claim 1, further comprising:an interlayer insulating layer covering the stack structure in the padregion, wherein the plurality of first separation regions include firstupper separation regions in contact with the interlayer insulating layerand first lower separation regions in contact with the stack structure,and wherein a first width of each of the first upper separation regionstaken in the second direction is greater than a second width of each ofthe first lower separation regions taken in the second direction.
 6. Thesemiconductor device of claim 1, wherein the plurality of secondseparation regions extend further than the plurality of first separationregions in the first direction on the substrate.
 7. The semiconductordevice of claim 6, wherein the plurality of second separation regionsare disposed in the cell array region and in the pad region, and theplurality of first separation regions are disposed in the pad region. 8.The semiconductor device of claim 1, wherein the extending portions aredisposed below the cell contact plugs.
 9. The semiconductor device ofclaim 1, wherein the cell contact plugs include first and second cellcontact plugs penetrating one of the second dummy insulating layers andhaving heights different from each other in a third directionsubstantially perpendicular to an upper surface of the substrate. 10.The semiconductor device of claim 9, wherein a difference in heightsbetween the first and second cell contact plugs is substantially thesame as a sum of a thickness of one of the gate electrodes and athickness of one of the mold insulating layers.
 11. The semiconductordevice of claim 1, wherein a gap between the first dummy insulatinglayers decreases towards an upper surface of the substrate in theplurality of first separation regions.
 12. The semiconductor device ofclaim 1, further comprising: at least one sacrificial layer disposedbetween the horizontal portions and the extending portions and includinga material different from a material of the gate electrodes.
 13. Thesemiconductor device of claim 1, further comprising: a peripheralcircuit region provided below the substrate, and including circuitelements electrically connected to the gate electrodes.
 14. Thesemiconductor device of claim 13, further comprising: a through-wiringelectrically connecting the cell array region to the peripheral circuitregion in the pad region, wherein the through-wiring is electricallyconnected to the cell contact plugs.
 15. A semiconductor device,comprising: a substrate having a cell array region and a pad region; astack structure including gate electrodes and mold insulating layershaving a staircase shape in the pad region; an interlayer insulatinglayer covering the stack structure in the pad region; a plurality offirst separation regions penetrating the stack structure and theinterlayer insulating layer in the pad region, wherein the plurality offirst separation regions include first insulating layers covering oneend of the gate electrodes and extending in a direction substantiallyperpendicular to an upper surface of the substrate, and secondinsulating layers disposed between the first insulating layers; aplurality of second separation regions dividing the stack structure intoa plurality of regions on the substrate and extending in a firstdirection; at least one dummy channel disposed between the plurality offirst separation regions and the plurality of second separation regions;and cell contact plugs penetrating the first insulating layers andconnected to the gate electrodes in the plurality of first separationregions.
 16. The semiconductor device of claim 15, wherein the at leastone dummy channel is spaced apart from the cell contact plugs.
 17. Thesemiconductor device of claim 15, wherein the first insulating layersinclude a material different from a material of the mold insulatinglayers.
 18. The semiconductor device of claim 15, wherein one or more ofthe plurality of first separation regions are disposed between theplurality of second separation regions.
 19. A semiconductor device,comprising: a substrate having a cell array region and a pad region; astack structure including gate electrodes and mold insulating layersalternately stacked on the substrate and having a staircase shape in thepad region; an interlayer insulating layer covering the stack structurein the pad region; dummy insulating layers dividing the stack structureand the interlayer insulating layer into a plurality of regions andincluding a material different from a material of the interlayerinsulating layer; extending portions in contact with the dummyinsulating layers in the stack structure, and spaced apart from oneanother in a direction substantially perpendicular to an upper surfaceof the substrate between the gate electrodes; and cell contact plugsdisposed in the dummy insulating layers and connected to the gateelectrodes.
 20. The semiconductor device of claim 19, wherein each ofthe extending portions has a recess portion having a concave shape.